Structural and optical analysis of SnO2 thin films BY Spray Pyrolysis

S. Roguai, A. Djelloul


Abstract: SnO2 thin films were deposited by ultrasound pyrolysis spray technique at 450°C. The films were characterized by X-ray diffraction, Fourier transformed infrared (FTIR), ultraviolet–visible and Photoluminescence spectroscopy. The tetragonal rutile-type structure was confirmed by X-ray diffraction with an average crystallite size of 35 nm. In addition, the FTIR study indicated the existence of two distinct characteristic absorptions which correspond to (0-Sn-O) deformations and (O-Sn) stretching modes. For the optical properties, the band gap energy was determined by Wemple-DiDomenico model. PL properties are ascribed to the presence of intrinsic defects.

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